Measurement of the polarizabilityof Mg-like Si2+ by study of the fine structure of high-L Rydberg states of Si+

R.A. Komara, M.A. Gearba, S.R. Lundeen
(Colorado State University),

C.W. Fehrenbach
(Kansas State Universtiy)

Fine structure intervals separating high-L, n=19 levels of Si^+ have been measured using the fast beam RESIS/microwave technique[1]. All intervals between L=9 and L=15 have been measured, and transitions up to the L=18 level have been resolved and used for studies of stray electric fields. The pattern of fine structure intervals is used to determine a precise value of the polarizability of the Mg-like core of this Rydberg system. Significant corrections for Stark shifts due to stray fields are required. The Rydberg ions are formed by charge transfer in a Rb Rydberg target [2] from a beam of Si^2+ ions and selectively detected using a Doppler tuned CO_2 laser.

This work was supported by the Chemical Sciences, Geosciences and Biosciences Division,
Office of Basic Energy Sciences, Office of Science, U.S. Department of Energy.

Submitted to DAMOP, May 2004 in Tucson, AZ.

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