Effect of Carrier Envelope Phase on Single Shot XUV Supercontinuum Measurements
Mahendra Man Shakya,
S. Gilbertson,
C. Nakamura,
C.Q. Li,
E. Moon,
Z. Duan,
J. Tackett,
S. Ghimire,
Zenghu Chang
( J.R. Macdonald Laboratory, Kansas State University, Manhattan KS 66506)
High order harmonic generation in argon gas was made with
polarization gated
$\sim $6 fs laser pulses. Phase matching of the harmonic field
was then
investigated by changing the gas pressure in a gas cell which had
two holes
on its wall drilled by the laser beam itself. The highest number
of photons
of a single XUV pulse was on the order of 10$^{4}$. A glancing
incident
grating spectrometer with a MCP imager was integrated into the
high harmonic
generation setup to measure the XUV spectrum. By having the half
divergence
angle of the XUV beam (3.5 mrad) matched with the acceptance
angle of the
grating, the throughput of the spectrometer has been maximized.
The XUV flux
is sufficient for measuring the single shot XUV spectrum in the
35-60 eV
photon energy range. The spectral profiles showed a
supercontinuum for some
shots and discrete harmonic peaks for the other shots. This shot
to shot
variation in the spectral profiles is attributed to a result of
the changes
of carrier envelope phase of the few-cycle laser pulses used for the
polarization gating.
This work was supported by the
Chemical Sciences, Geosciences and Biosciences Division,
Submitted to DAMOP, May 2006 in Knoxville, TN.
Office of Basic Energy Sciences,
Office of Science, U.S. Department of Energy.
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